Systematic comparison of commercial devices for temporal characterization of few-cycle laser pulses in the 500-1000 nm spectral range

We compare multiple temporal pulse characterization techniques in three different pulse duration regimes from 15 fs to sub-5 fs, as there are no available standards yet for measuring such ultrashort pulses. To accomplish this, a versatile post-compression platform was developed, where the 100 fs nea...

Teljes leírás

Elmentve itt :
Bibliográfiai részletek
Szerzők: Pajer Viktor
Bohus János
Malakzadeh Fard Khangheshlaghi Abdollah
Lehotai Levente
Kalashnikov Mikhail
Seres Imre
Gilicze Barnabás
Kiss Bálint
Börzsönyi Ádám
Varjú Katalin
Szabó Gábor
Nagymihály Roland Sándor
Dokumentumtípus: Cikk
Megjelent: 2024
Sorozat:OPTICS EXPRESS 32 No. 9
Tárgyszavak:
doi:10.1364/OE.509583

mtmt:34836411
Online Access:http://publicatio.bibl.u-szeged.hu/33582
Leíró adatok
Tartalmi kivonat:We compare multiple temporal pulse characterization techniques in three different pulse duration regimes from 15 fs to sub-5 fs, as there are no available standards yet for measuring such ultrashort pulses. To accomplish this, a versatile post-compression platform was developed, where the 100 fs near infrared pulses were post-compressed to the sub-two-cycle regime in a hybrid, three-stage configuration. After each stage, the duration of the compressed pulse was measured with the d-scan, TIPTOE and SRSI techniques and the retrieved temporal intensity profiles, spectrum and spectral phases were compared. Spectral homogeneity was also measured with an imaging spectrometer to understand the input coupling conditions of the temporal measurements. Our findings suggest that the different devices give similar results in terms of temporal intensity profile, however they are extremely sensitive to alignment and to beam quality, especially in the case of the shortest pulses. We address specific steps of measurement procedures, which paves the way towards the standardization of pulse characterization in the near future.
Terjedelem/Fizikai jellemzők:15710-15722
ISSN:1094-4087