A benchmark ab initio study of the complex potential energy surfaces of the OH- + CH3CH2Y [Y = F, Cl, Br, I] reactions

We provide the first benchmark characterization of the OH- + CH3CH2Y [Y = F, Cl, Br, I] reactions utilizing the high-level explicitly-correlated CCSD(T)-F12b method with the aug-cc-pVnZ [n = 2(D), 3(T), 4(Q)] basis sets. We explore and analyze the stationary points of the elimination (E2) and substi...

Teljes leírás

Elmentve itt :
Bibliográfiai részletek
Szerzők: Tasi Domonkos Attilaó
Tokaji Csenge
Czakó Gábor
Dokumentumtípus: Cikk
Megjelent: 2021
Sorozat:PHYSICAL CHEMISTRY CHEMICAL PHYSICS 23 No. 24
Tárgyszavak:
doi:10.1039/d1cp01303c

mtmt:32259314
Online Access:http://publicatio.bibl.u-szeged.hu/22659
Leíró adatok
Tartalmi kivonat:We provide the first benchmark characterization of the OH- + CH3CH2Y [Y = F, Cl, Br, I] reactions utilizing the high-level explicitly-correlated CCSD(T)-F12b method with the aug-cc-pVnZ [n = 2(D), 3(T), 4(Q)] basis sets. We explore and analyze the stationary points of the elimination (E2) and substitution (S(N)2) reactions, including anti-E2, syn-E2, back-side attack, front-side attack, and double inversion. In all cases, S(N)2 is thermodynamically more preferred than E2. In the entrance channel of S(N)2 a significant front-side complex formation is revealed, and in the product channel the global minimum of the title reactions is obtained at the hydrogen-bonded CH3CH2OHMIDLINE HORIZONTAL ELLIPSISY- complex. Similar to the OH- + CH3Y reactions, double inversion can proceed via a notably lower-energy pathway than front-side attack, moreover, for Y = I double inversion becomes barrier-less. For the transition state of the anti-E2, a prominent ZPE effect emerges, giving an opportunity for a kinetically more favored pathway than back-side attack. In addition to S(N)2 and E2, other possible product channels are considered, and in most cases, the benchmark reaction enthalpies are in excellent agreement with the experimental data.
Terjedelem/Fizikai jellemzők:13526-13534
ISSN:1463-9076