Effect of strain in nickel ferrite thin films
Nickel ferrite epitaxial thin films grown by PLD technique simultaneously in a series of different thickness varying from 3 to 200 nm on the three (001) orientated substrates SrTiO3 (STO), MgO and 0.72Pb(Mg1/3Nb2/3)O3–0.28PbTiO3 (PMN-PT) are studied in this paper. The effects of epitaxial strain on...
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| Dokumentumtípus: | Könyv része |
| Megjelent: |
2015
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| Sorozat: | Proceedings of the International Symposium on Analytical and Environmental Problems
21 |
| Kulcsszavak: | Elektrokémia |
| Online Access: | http://acta.bibl.u-szeged.hu/55982 |
| Tartalmi kivonat: | Nickel ferrite epitaxial thin films grown by PLD technique simultaneously in a series of different thickness varying from 3 to 200 nm on the three (001) orientated substrates SrTiO3 (STO), MgO and 0.72Pb(Mg1/3Nb2/3)O3–0.28PbTiO3 (PMN-PT) are studied in this paper. The effects of epitaxial strain on the lattice structure, microstructure and magnetization of nickel ferrite thin films have been studied on several types of single-crystalline substrates with different lattice mismatch. The XRD difractograms show only (00l) substrate peaks and peaks that can be assigned to the (00l) reflexes of the spinel phase. The films are out-of-plane epitaxial oriented to the substrate. The thinnest films grown on STO and PMN-PT are under a small compressive strain, especially the films on PMN-PT. Here, the strain relaxation is not complete and the strain that is imposed by the substrates is partially maintained. With increasing thickness the strain relaxation of the films proceeds and the strain turns from compressive to tensile. The magnetic properties of a 200 nm nickel ferrite film deposited on STO, MgO and PMN-PT are investigated and correlated with the strain states of the films. The film grown on MgO has the smallest coercive field (980 Oe), whereas the coercive fields of the films grown on STO (2070 Oe) and PMN-PT (2360 Oe) are larger and of about the same magnitude. |
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| Terjedelem/Fizikai jellemzők: | 277-281 |
| ISBN: | 978-963-306-411-5 |