On the complexity of dynamic tests for logic functions

A generalization of the concept of dynamic test is proposed for detecting logic and parametric faults at input / output terminals of logic networks realizing k— valued logic functions (k > 2). Upper and lower bounds on the complexity (i.e., length) of minimal dynamic tests are obtained for variou...

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Bibliographic Details
Main Author: Vardanân V. A.
Format: Article
Published: 1994
Series:Acta cybernetica 11 No. 4
Kulcsszavak:Számítástechnika, Kibernetika
Subjects:
Online Access:http://acta.bibl.u-szeged.hu/12537
Description
Summary:A generalization of the concept of dynamic test is proposed for detecting logic and parametric faults at input / output terminals of logic networks realizing k— valued logic functions (k > 2). Upper and lower bounds on the complexity (i.e., length) of minimal dynamic tests are obtained for various classes of logic functions.
Physical Description:333-343
ISSN:0324-721X