On the complexity of dynamic tests for logic functions

A generalization of the concept of dynamic test is proposed for detecting logic and parametric faults at input / output terminals of logic networks realizing k— valued logic functions (k > 2). Upper and lower bounds on the complexity (i.e., length) of minimal dynamic tests are obtained for variou...

Teljes leírás

Elmentve itt :
Bibliográfiai részletek
Szerző: Vardanân V. A.
Dokumentumtípus: Cikk
Megjelent: 1994
Sorozat:Acta cybernetica 11 No. 4
Kulcsszavak:Számítástechnika, Kibernetika
Tárgyszavak:
Online Access:http://acta.bibl.u-szeged.hu/12537
Leíró adatok
Tartalmi kivonat:A generalization of the concept of dynamic test is proposed for detecting logic and parametric faults at input / output terminals of logic networks realizing k— valued logic functions (k > 2). Upper and lower bounds on the complexity (i.e., length) of minimal dynamic tests are obtained for various classes of logic functions.
Terjedelem/Fizikai jellemzők:333-343
ISSN:0324-721X