Clustering empirical failure rate curves for reliability prediction purposes in case of consumer electronic products

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Bibliographic Details
Main Authors: Dombi József
Jónás Tamás
Tóth Zsuzsanna Eszter
Format: Article
Published: 2016
Series:QUALITY AND RELIABILITY ENGINEERING INTERNATIONAL 32 No. 3
doi:10.1002/qre.1815

mtmt:2880381
Online Access:http://publicatio.bibl.u-szeged.hu/17651
Description
Physical Description:1071-1083
ISSN:0748-8017